Please use this identifier to cite or link to this item: http://hdl.handle.net/10071/8591
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dc.contributor.authorMartins, J. L.-
dc.contributor.authorMartins, S. F.-
dc.contributor.authorFonseca, R. A.-
dc.contributor.authorSilva, L. O.-
dc.date.accessioned2015-03-10T17:20:05Z-
dc.date.available2015-03-10T17:20:05Z-
dc.date.issued2010-06-
dc.identifier.isbn978-0-7354-0853-1-
dc.identifier.issn0094-243X-
dc.identifier.urihttps://ciencia.iscte-iul.pt/public/pub/id/6398-
dc.identifier.urihttp://hdl.handle.net/10071/8591-
dc.descriptionWOS:000287176200029 (Nº de Acesso Web of Science)-
dc.description.abstractA massivelly parallel post-processing radiation diagnostic for PIC codes is presented, which is then used to study the main features of the radiation from single LWFA stages (1.5 GeV and 12 GeV). This diagnostic also allows to examine radiation signatures associated with the physics of self-injection.por
dc.language.isoengpor
dc.publisherAIPpor
dc.relationinfo:eu-repo/grantAgreement/FCT/SFRH/SFRH%2FBD%2F39523%2F2007/PT-
dc.rightsopenAccesspor
dc.subjectBetatron radiationpor
dc.subjectPIC codespor
dc.subjectLaser wakefield accelerationpor
dc.titleRadiation in 1.5 GeV and 12 GeV laser wakefield acceleration stages from PIC simulationspor
dc.typeconferenceObjecten_US
dc.event.title14th Advanced Accelerator Concepts Workshop, AIP Conference Proceedingspor
dc.event.typeConferênciapor
dc.event.locationAnnapolis, MDpor
dc.event.dateJUN 13-19, 2010por
dc.pagination191-196por
dc.publicationstatusPublicadopor
dc.peerreviewedSimpor
dc.relation.publisherversionThe definitive version is available at: http://scitation.aip.org/content/aip/proceeding/aipcp/10.1063/1.3520312por
dc.journalADVANCED ACCELERATOR CONCEPTS: 14th Advanced Accelerator Concepts Workshop, AIP Conference Proceedingsen_US
dc.volume1299en_US
degois.publication.firstPage191por
degois.publication.lastPage196por
degois.publication.locationAnnapolis, USApor
degois.publication.titleADVANCED ACCELERATOR CONCEPTS: 14th Advanced Accelerator Concepts Workshop, AIP Conference Proceedingspor
dc.date.updated2015-03-10T17:13:57Z-
dc.identifier.doi10.1063/1.3520312-
Appears in Collections:CTI-CRI - Comunicações a conferências internacionais

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